Methods of measurement for semiconductor materials, process control, and devices; quarterly report.
- Publisher: [For sale by the Supt. of Docs., U.S. Govt. Print. Off.]
- Print ISSN: 0090-8541
- Electronic ISSN: 0090-8541
- OCLC Number: 1785732
- Subject: Semiconductors Periodicals.
- Subject code: QC
- Publication history:
Print Holdings
| Archiving Institution | Program | Holdings Description | Retention |
|---|---|---|---|
| HathiTrust (HATHI) | HTDL | July/Sept 1968 (r:472); Oct/Dec 1968 (r:475); Jan/Mar 1969 (r:488); Oct/Dec 1969 (r:527); July/Sept 1969 (r:520); Apr/June 1969 (r:495); Jul/Sep 1970 (r:571); Oct/Dec 1970 (r:592); Apr/June 1970 (r:560); Jan/Mar 1970 (r:555); Oct/Dec 1971 (r:727); July/Sept 1971 (r:717); Apr/June 1971 (r:702); Jan/Mar 1971 (r:598); Jan/Mar 1972 (r:733); Jul/Sep 1972 (r:754); Oct/Dec 1972 (r:773); Apr/June 1972 (r:743); Jan/Mar 1973 (r:788); Apr/June 1973 (r:806) | permanent |