Proceedings / Annual IEEE Semiconductor Thermal Measurement and Management Symposium.
- Publisher: Institute of Electrical and Electronics Engineers
- Print ISSN: 1065-2221
- Electronic ISSN:
- OCLC Number: 23885876
- Subject: Semiconductors Thermal properties Congresses.
- Subject code: T
- Publication history: 7th (1991)-
Print Holdings
| Archiving Institution | Program | Holdings Description | Retention |
|---|---|---|---|
| HathiTrust (HATHI) | HTDL | 92CH3095-7 1992; 93CH3226-8 1993; 94CH3413-2 1994; 95CH35733 1995; 96CB35890 1996; 97CB36031 1997; 98CB36195 1998; 99CB36306 1999; 00CB37068 2000; 01CH37189 2001; 02CH37311 2002; 03CH37437 2003; 04CH37545 2004; 05CH37651 2005; 91CH2972-8 1991 | permanent |
| University of Illinois at Urbana Champaign Shared Print in Storage (UIUSP) | Big Ten Academic Alliance (BTAA) Shared Print Repository | v.7(1991)-v.20(2004) | 20420630 |
| University of Kansas Shared Print in Storage (KKU) | WEST, WEST Bronze | v.7-18(1991-2002) | 20351231 |