Proceedings /IEEE VLSI Test Symposium.

  • Publisher: IEEE Computer Society Press
  • Print ISSN: 1093-0167
  • Electronic ISSN:
  • OCLC Number: 32735362
  • Subject: Integrated circuits Very large scale integration Testing Congresses.
  • Subject code: T
  • Publication history: Began in 1991.

Print Holdings

Archiving Institution Program Holdings Description Retention
HathiTrust (HATHI) HTDL 12th 1994; 13th 1995; 14th 1996; 15th 1997; 16th 1998; 17th 1999; 18th 2000; 19th 2001; 20th 2002; 22(2003:2) permanent
University of California, NRLF Shared Print (ZAP) WEST, WEST Bronze, UCL Shared Print 1993(11), 1997(15)-1999(17), 2001(19)-2004(22) 20351231