Proceedings /IEEE VLSI Test Symposium.
- Publisher: IEEE Computer Society Press
- Print ISSN: 1093-0167
- Electronic ISSN:
- OCLC Number: 32735362
- Subject: Integrated circuits Very large scale integration Testing Congresses.
- Subject code: T
- Publication history: Began in 1991.
Print Holdings
Archiving Institution |
Program |
Holdings Description |
Retention |
HathiTrust (HATHI) |
HTDL |
12th 1994; 13th 1995; 14th 1996; 15th 1997; 16th 1998; 17th 1999; 18th 2000; 19th 2001; 20th 2002; 22(2003:2)
|
permanent
|
University of California, NRLF Shared Print (ZAP) |
WEST, WEST Bronze, UCL Shared Print |
1993(11), 1997(15)-1999(17), 2001(19)-2004(22)
|
20351231
|