IEEE transactions on device and materials reliability : a publication of the IEEE Electron Devices Society and the IEEE Reliability Society.
- Publisher: Institute of Electrical and Electronics Engineers
- Print ISSN: 1530-4388
- Electronic ISSN:
- OCLC Number: 44161177
- Subject: Electronic industries Quality control Periodicals.
- Subject code: T
- Publication history: Vol. 1, no. 1 (Mar. 2001)-
Print Holdings
| Archiving Institution | Program | Holdings Description | Retention |
|---|---|---|---|
| Georgia Institute of Technology (GAT) | Scholars Trust | v.1 (2001)-v.3 (2003) | 20351231 |
| HathiTrust (HATHI) | HTDL | v.5 no.1-2 | permanent |
| Linda Hall Library of Science, Engineering & Technology (LHL) | Linda Hall Library of Science, Engineering & Technology | v.1( 2001)-v.4(2004); v1(2001); Vol. 2 no. 1 (March 2002) - Vol. 2 no. 3 (September 2002); Vol. 3 no. 1 (March 2003); Vol. 3 no. 3 (September 2003); v.5:no.1-2,4(2005); v.6(2006); v.7:no.1-2,4(2007); v.8(2008)-v.9(2009) | |
| North Carolina State University (NRC) | Scholars Trust | v.1(2001)-v.18(2018) | 20351231 |
| University of California, NRLF Shared Print (ZAP) | WEST, WEST Gold, UCL Shared Print, IEEE Journals | v.1(2001)-9(2009) | 20351231 |
| University of Florida (FUG) | Florida Academic Repository (FLARE), Scholars Trust | v.1(2001)-v.8(2008) | 20351231 |
| University of Illinois at Urbana Champaign Shared Print in Storage (UIUSP) | Big Ten Academic Alliance (BTAA) Shared Print Repository | v.1(2001)-v.6(2006) | 20420630 |