Records of the ... IEEE International Workshop on Memory Technology, Design, and Testing / sponsored by the IEEE Computer Society Technical Committee on Test Technology [and] the IEEE Computer Society Technical Committee on VLSI ; in cooperation with the IEEE Solid State Circuits Council.
- Publisher: IEEE Computer Society Press
- Print ISSN: 1087-4852
- Electronic ISSN:
- OCLC Number: 33274241
- Subject: Semiconductor storage devices Testing Congresses.
- Subject code: T
- Publication history:
Print Holdings
| Archiving Institution | Program | Holdings Description | Retention |
|---|---|---|---|
| HathiTrust (HATHI) | HTDL | 95TH8065 1995; 96TB100042 1996; 97TB100159 1997; 98TB100236 1998; PR00259 1999; PR00689 2000; PR01242 2001; PR01617 2002; PR02004 2003; P2193 2004; P2313 2005 | permanent |
| University of California, NRLF Shared Print (ZAP) | WEST, WEST Bronze, UCL Shared Print | 1997-1999, 2001-2004 | 20351231 |