Proceedings: Annual Reliability and Maintainability Symposium.

  • Publisher: Institute of Electrical and Electronics Engineers
  • Print ISSN: 0149-144X
  • Electronic ISSN:
  • OCLC Number: 3451180
  • Subject: Reliability (Engineering) Congresses.
  • Subject code: T
  • Publication history: 1972-

Print Holdings

Archiving Institution Program Holdings Description Retention
HathiTrust (HATHI) HTDL 80CH1618-8; 82CH1732-7; 83CH1853-1; v.1-3 1954-1957; v.4-5 1958-1959; v.6 1960; v.7 1961; v.9 1963; v.10 1964; v.11 1965; 1967-1968; 1972-1975; 1991; 93CH3257-3 1993; 94CH3391-0 1994; 95CH35743 1995; 96CB35885 1996; 1997; 97CB36029 1997; 98CB36161 1998; 00CB37055 2000; 01CH37179 2001; 02CH37318 2002; 03CH37415 2003; 04CH37506 2004; 05CH37617 2005; 76CH1044-7 RQC; 77CH1161-9 RQC; 78CH1308-6 RQC; 79CH1429-0; 80CH1513-1; 84CH1992-7 1984; 85CH2120-4; 86CH2247-5; 87CH2397-8; 88CH2551-0 1988; 89CH2580-9 1989; 90CH2804-3; 91CH2966-0 1991; 92CH3108-8 permanent
University of California, Santa Barbara Shared Print in Place (CUT) WEST, WEST Bronze 1972-2003, 2002, 2003 December 31, 2035
University of Florida (FUG) Florida Academic Repository (FLARE), Scholars Trust 1988-2003 20351231
University of Illinois at Urbana Champaign Shared Print in Storage (UIUSP) Big Ten Academic Alliance (BTAA) Shared Print Repository 1984-2004 20420630
Washington Research Library Consortium (CAO) Scholars Trust, WRLC 1972-2002 20351231