Testing, reliability, and application of micro- and nano-material systems ... /
- Publisher: SPIE
- Print ISSN:
- Electronic ISSN:
- OCLC Number: 56125952
- Subject: Electrooptical devices Materials Testing Congresses.
- Subject code: T
- Publication history: [1] (3-5 Mar., 2003)-
Print Holdings
| Archiving Institution | Program | Holdings Description | Retention |
|---|---|---|---|
| HathiTrust (HATHI) | HTDL | 2003-2006 | permanent |