Advanced characterization techniques for optics, semiconductors, and nanotechnologies.
- Publisher: SPIE
- Print ISSN:
- Electronic ISSN:
- OCLC Number: 62387852
- Subject: Optoelectronics Congresses.
- Subject code: T
- Publication history: [1] (3-5 Aug. 2003)-
Print Holdings
| Archiving Institution | Program | Holdings Description | Retention |
|---|---|---|---|
| HathiTrust (HATHI) | HTDL | 2003; 2005 | permanent |