Advances in metrology for x-ray and EUV optics.
- Publisher: SPIE
- Print ISSN:
- Electronic ISSN:
- OCLC Number: 182959226
- Subject: Optical measurements Congresses.
- Subject code: T
- Publication history: 2005-
Print Holdings
| Archiving Institution | Program | Holdings Description | Retention |
|---|---|---|---|
| HathiTrust (HATHI) | HTDL | 2005 | permanent |