Two- and three-dimensional methods for inspection and metrology.
- Publisher: SPIE
- Print ISSN:
- Electronic ISSN:
- OCLC Number: 77126502
- Subject: Computer vision Congresses.
- Subject code: T
- Publication history: 3 (24-26 Oct. 2005)-
Print Holdings
| Archiving Institution | Program | Holdings Description | Retention |
|---|---|---|---|
| HathiTrust (HATHI) | HTDL | 2005-2006 | permanent |