Proceedings of the ... International Conference on Microelectronic Test Structures / IEEE International Conference on Microelectronic Test Structures.
- Publisher: Institute of Electrical and Electronics Engineers
- Print ISSN: 1071-9032
- Electronic ISSN:
- OCLC Number: 20480732
- Subject: Integrated circuits Testing Congresses.
- Subject code:
- Publication history: 1989-
Print Holdings
| Archiving Institution | Program | Holdings Description | Retention |
|---|---|---|---|
| HathiTrust (HATHI) | HTDL | 92CH3102-1 1992; 93CH3220-1 1993; 94CH3380-3 1994; 95CH3480-1 1995; 96CB35832 1996; 97CB35914 1997; 98CB36157 1998; 00CB37095 2000; 01CH37153 2001; 02CH37357 2002; 03CH37402 2003; 04CH37516 2004; 05CH37622 2005; 89CH2693-0 1989; 90CH2797-9 1990; 91CH2907-4 1991; 99CB36307 | permanent |
| HathiTrust (HATHI) | HTDL | 1988 | permanent |
| Oregon State University Shared Print in Place (ORE) | WEST, WEST Bronze | 1989, 1990-2000 | 20351231 |
| University of California, NRLF Shared Print (ZAP) | WEST, WEST Bronze, UCL Shared Print | 1989-2004 | 20351231 |
| University of Illinois at Urbana Champaign Shared Print in Storage (UIUSP) | Big Ten Academic Alliance (BTAA) Shared Print Repository | 1989-2004 | 20420630 |