Proceedings of the ... International Conference on Microelectronic Test Structures / IEEE International Conference on Microelectronic Test Structures.

Publisher: Institute of Electrical and Electronics Engineers
Print ISSN: 1071-9032
Electronic ISSN:
OCLC Number: 20480732

Program: Western Regional Storage Trust

Validation: None
Retention: 20351231
Institution: University of California, NRLF Shared Print
Facility: University of California Northern Regional Library Facility (NRLF)
OCLC Symbol: ZAP
Holdings Format: Print

Materials	Archive Action	Date of Action	Program	Status/Note
1989-2004	committed to retain	2021-04-05	WEST, WEST Bronze, UCL Shared Print

* These holdings are committed to multiple archiving programs: WEST , UCL Shared Print